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Browsing by Author "Optical Measurement Systems for Industrial Inspection (5th:2007:Munich)"

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Browsing by Author "Optical Measurement Systems for Industrial Inspection (5th:2007:Munich)"

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Date Title Author Type
2007
Double exposure time averaged in-line digital holography.
Singh, Vijay Raj.; Anand, Asundi.; Miao, Jianmin.
Conference Paper