Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/98251
Title: Investigation of surface and subsurface profile, techniques of measurement, and replication of the Chinese Magic Mirror
Authors: Teoh, Eden Kang Min
May, Watt Sook
Sreemathy, Parthasarathy
Huang, Lei
Asundi, Anand Krishna
Issue Date: 2013
Source: Teoh, E. K. M., May, W. S., Sreemathy, P., Huang, L., & Asundi, A. K. (2013). Investigation of surface and subsurface profile, techniques of measurement, and replication of the Chinese Magic Mirror. Proceeding of SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 876930.
Conference: International Conference on Optics in Precision Engineering and Nanotechnology (2013 : Singapore)
Abstract: The Chinese magic mirror is an ancient convex bronze mirror, it reflects parallel light rays to form a unique image within the reflected patch of light by altering the reflected ray paths. Using Phase Measuring Reflectometry (PMR), surface irregularities of a micron range were found to be present on the mirror; these irregularities concentrate and disperse reflected light rays, giving rise to brighter and darker patches on the reflected image, forming a contrast, allowing the unique pattern to be observed. To ascertain location and nature of the surface defects that come in forms of indentations and raised platforms, other measurement techniques were employed. Reverse engineering then facilitated the exploration of reproduction of a very own original Chinese Magic Mirror with the use of optical principles behind the mirror.
URI: https://hdl.handle.net/10356/98251
http://hdl.handle.net/10220/13367
DOI: 10.1117/12.2021112
Schools: School of Mechanical and Aerospace Engineering 
Rights: © 2013 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) and is made available as an electronic reprint (preprint) with permission of SPIE. The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.2021112].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Conference Papers

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