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Date	Title	Author	Type
2008	A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing.	Kim, Tae Hyoung.; Liu, Jason.; Keane, John.; Kim, Chris H.	Journal Article
2008	Silicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuits.	Kim, Tae Hyoung.; Persaud, Randy.; Kim, Chris H.	Journal Article
2008	Stack sizing for optimal current drivability in subthreshold circuits.	Keane, John.; Eom, Hanyong.; Kim, Tae Hyoung.; Sapatnekar, Sachin.; Kim, Chris H.	Journal Article
2007	Utilizing reverse short-channel effect for optimal subthreshold circuit design.	Kim, Tae Hyoung.; Keane, John.; Eom, Hanyong.; Kim, Chris H.	Journal Article
2009	A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode.	Kim, Tae Hyoung.; Liu, Jason.; Kim, Chris H.	Journal Article

Now showing items 1-5 of 5