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Now showing items 1-8 of 8

Date	Title	Author	Type
2001	Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes.	Chi, Dong Zhi.; Mangelinck, D.; Lahiri, S. K.; Lee, Pooi See.; Pey, Kin Leong.	Journal Article
2002	Effect of ion implantation on layer inversion of Ni silicided poly-Si.	Lee, Pooi See.; Pey, Kin Leong.; Mangelinck, D.; Ding, J.; Chi, Dong Zhi.; Osipowicz, T.; Dai, J. Y.; Chan, L.	Journal Article
2000	Improved NiSi salicide process using presilicide N2+ implant for MOSFETs.	Lee, Pooi See.; Pey, Kin Leong.; Mangelinck, D.; Ding, J.; Wee, A. T. S.; Chan, L.	Journal Article
2002	Layer inversion of Ni(Pt)Si on mixed phase Si films.	Lee, Pooi See.; Pey, Kin Leong.; Mangelinck, D.; Ding, J.; Osipowicz, T.; See, A.	Journal Article
2000	Micro-raman spectroscopy investigation of nickel silicides and nickel (platinum) silicides.	Lee, Pooi See.; Mangelinck, D.; Pey, Kin Leong.; Shen, Z. X.; Ding, J.; Osipowicz, T.; See, A.	Journal Article
2001	New salicidation technology with Ni(Pt) alloy for MOSFETs.	Lee, Pooi See.; Pey, Kin Leong.; Mangelinck, D.; Ding, J.; Chi, Dong Zhi.; Chan, L.	Journal Article
2005	On the morphological changes of Ni- and Ni(Pt)-silicides.	Lee, Pooi See.; Pey, Kin Leong.; Mangelinck, D.; Chi, Dong Zhi.; Osipowicz, T.	Journal Article
2002	Phase and layer stability of Ni- and Ni(Pt)-silicides on narrow poly-Si lines.	Lee, Pooi See.; Pey, Kin Leong.; Mangelinck, D.; Ding, J.; Chi, Dong Zhi.; Dai, J. Y.; Chan, L.	Journal Article

Now showing items 1-8 of 8