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Browsing EEE Conference Papers by Author "IEEE International Conference on Management of Innovation and Technology."

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Browsing EEE Conference Papers by Author "IEEE International Conference on Management of Innovation and Technology."

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Date Title Author Type
2000
Multiple regression models for electronic product success prediction.
Lo, Frank Cheong Wah.; Foo, Say Wei.; Bauly, John A.
Conference Paper
2000
Software risk assessment model.
Foo, Say Wei.; Arumugam Muruganantham.
Conference Paper
2000
Typical management shortfalls in New Product Development (NPD) and their avoidance.
Bauly, John A.; Foo, Say Wei.
Conference Paper