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Software risk assessment model

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dc.contributor.author Foo, Say Wei
dc.contributor.author Arumugam Muruganantham
dc.date.accessioned 2009-05-22T05:58:35Z
dc.date.available 2009-05-22T05:58:35Z
dc.date.copyright 2000
dc.date.issued 2009-05-22T05:58:35Z
dc.identifier.citation Foo, S. W., & Arumugam, M. (2000). Software risk assessment model. IEEE International Conference on Management of Innovation and Technology, 2, 536-544.
dc.identifier.uri http://hdl.handle.net/10220/4607
dc.description.abstract The software industry has grown rapidly with the increasing applications of information technology. Just like any development projects. Failure to develop software according to specifications or within budget, or to deliver software products on time can be costly. In this paper, a new model for the assessment of risk in software projects is proposed. The model, named Software Risk Assessment Model (SRAM), makes use of a comprehensive questionnaire. Test results show that using the risk indicator obtained from the SRAM, it is possible to predict the possible outcome of software projects with good accuracy.
dc.format.extent 9 p.
dc.language.iso en
dc.rights © IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
dc.title Software risk assessment model
dc.type Conference Paper
dc.contributor.conference IEEE International Conference on Management of Innovation and Technology (1st : 2000 : Singapore)
dc.description.version Accepted version

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