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Title:
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An injection-nulling switch for switched-capacitor circuit applications.
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Author:
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Lee, W. F.; Chan, Pak Kwong.
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Copyright year:
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2005 |
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Abstract:
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This paper presents a new switch, the injection-nulling switch (INS), for minimizing both the charge injection error and the clock feedthrough error in switched-capacitor circuits. Comprised of two identically designed MOS transistors and
a capacitor, INS benefits from using matching transistor characteristics,
which result in an improvement in the reduction of switch errors on the conventional techniques. In this paper, the working mechanism of the INS technique and the analysis of the impact of nonideal effects on the switch are described. A comparison with other switch employments using sample-and-hold circuit implementation
in AMS 0.6- m CMOS technology is also discussed. The simulation results have verified that the proposed method is insensitive to the nonideal effects. Besides, its effectiveness has also been validated by the experimental results. |
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Subject:
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DRNTU::Engineering::Electrical and electronic engineering. |
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Type:
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Journal Article |
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Series/ Journal Title:
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IEEE transactions on instrumentation and measurement |
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School:
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School of Electrical and Electronic Engineering |
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Rights:
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© 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. |
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Version:
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Published version |
