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Application of Wigner–Ville distribution in electromigration noise analysis

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Application of Wigner–Ville distribution in electromigration noise analysis

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dc.contributor.author Tan, Cher Ming
dc.contributor.author Lim, Shin Yeh
dc.date.accessioned 2009-06-23T03:03:24Z
dc.date.available 2009-06-23T03:03:24Z
dc.date.copyright 2002
dc.date.issued 2009-06-23T03:03:24Z
dc.identifier.citation Tan, C. M., & Lim, S. Y. (2002). Application of Wigner-Ville distribution in electromigration noise analysis. IEEE Transactions on Device and Materials Reliability, 2(2), 30-35.
dc.identifier.issn 1530-4388
dc.identifier.uri http://hdl.handle.net/10220/4655
dc.description.abstract Electromigration noise analysis has shown great potential for the nondestructive evaluation of electromigration performance of metal stripe. However, contradictive conclusions have been published from the electromigration noise analysis. These contradictive conclusions mainly stem from the complex dynamics of the atomic movement during electromigration, rendering the electromigration noise as a nonstationary signal, and, hence, the standard Fourier transform is not adequate. Among the various nonstationary signal analysis tools,Wigner–Ville distribution is used for the analysis of electromigration noise data for the first time. It is found that much “hidden” and useful information in the noise data can be revealed by using this distribution. These information will enable us to “see” the dynamic of the atomic movement during electromigration, enhancing our understanding of electromigration processes.
dc.format.extent 6 p.
dc.language.iso en
dc.relation.ispartofseries IEEE transactions on device and materials reliability
dc.rights © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site.
dc.subject DRNTU::Engineering::Electrical and electronic engineering.
dc.title Application of Wigner–Ville distribution in electromigration noise analysis
dc.type Journal Article
dc.contributor.school School of Electrical and Electronic Engineering
dc.identifier.doi http://dx.doi.org/10.1109/TDMR.2002.802114
dc.description.version Published version

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