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An efficient method for parametric yield gradient estimation

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An efficient method for parametric yield gradient estimation

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dc.contributor.author Wu, Ting
dc.contributor.author Foo, Say Wei
dc.date.accessioned 2009-07-29T08:55:47Z
dc.date.available 2009-07-29T08:55:47Z
dc.date.copyright 1999
dc.date.issued 2009-07-29T08:55:47Z
dc.identifier.citation Wu, T., & Foo, S. W. (1999). An efficient method for parametric yield gradient estimation. In Proceedings of the IEEE International Symposium on Circuits and Systems, (pp. 419-422). Singapore: National University of Singapore.
dc.identifier.uri http://hdl.handle.net/10220/5850
dc.description.abstract A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach.
dc.format.extent 4 p.
dc.language.iso en
dc.rights © IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site
dc.subject DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering
dc.title An efficient method for parametric yield gradient estimation
dc.type Conference Paper
dc.contributor.conference IEEE International Symposium on Circuits and Systems (1999 : Orlando, Florida, US)
dc.contributor.school School of Electrical and Electronic Engineering
dc.identifier.doi http://dx.doi.org/10.1109/ISCAS.1999.777897
dc.description.version Published version

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