| dc.contributor.author |
Tarateeraseth, Vuttipon. |
| dc.contributor.author |
Hu, Bo. |
| dc.contributor.author |
See, Kye Yak. |
| dc.contributor.author |
Canavero, Flavio G. |
| dc.date.accessioned |
2010-04-08T00:59:27Z |
| dc.date.available |
2010-04-08T00:59:27Z |
| dc.date.copyright |
2010 |
| dc.date.issued |
2010-04-08T00:59:27Z |
| dc.identifier.citation |
Tarateeraseth, V., Hu, B., See, K. Y., & Canavero, F. G. (2010). Accurate extraction of noise source impedance of an SMPS under operating conditions. IEEE Transactions On Power Electronics. 25(1). 111-117. |
| dc.identifier.issn |
0885-8993 |
| dc.identifier.uri |
http://hdl.handle.net/10220/6219 |
| dc.description.abstract |
An accurate measurement method to extract the common
mode (CM) and the differential mode (DM) noise source
impedances of a switched-mode power supply (SMPS) under its
operating condition is developed and validated. With a proper
premeasurement calibration process, the proposed method allows
extraction of both the CM and the DM noise source impedances
with very good accuracy. These noise source impedances come in
handy to design an electromagnetic interference filter for an SMPS
systematically with minimum hassle. |
| dc.format.extent |
7 p. |
| dc.language.iso |
en |
| dc.relation.ispartofseries |
IEEE transaction on power electronics |
| dc.title |
Accurate extraction of noise source impedance of an SMPS under operating conditions. |
| dc.type |
Journal Article |
| dc.contributor.school |
School of Electrical and Electronic Engineering |
| dc.identifier.doi |
http://dx.doi.org/10.1109/TPEL.2009.2024675 |
| dc.description.version |
Published version |
