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Title:
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Stack sizing for optimal current drivability in subthreshold circuits.
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Author:
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Keane, John.; Eom, Hanyong.; Kim, Tae Hyoung.; Sapatnekar, Sachin.; Kim, Chris H.
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Copyright year:
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2008 |
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Abstract:
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Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors in the subthreshold region are significantly different from those in strong inversion. This presents new challenges in design optimization, particularly in complex gates with stacks of transistors. In this paper, we present a framework for choosing the optimal transistor stack sizing factors in terms of current drivability for subthreshold designs. We derive a closed-form solution for the correct sizing of transistors in a stack, both in relation to other transistors in the stack, and to a single device with equivalent current derivability. Simulation results
show that our framework provides a performance benefit ranging up to more than 10% in certain critical paths. |
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Subject:
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DRNTU::Engineering::Electrical and electronic engineering. |
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Type:
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Journal Article |
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Series/ Journal Title:
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IEEE transactions on very large scale integration (VLSI) systems |
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School:
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School of Electrical and Electronic Engineering |
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Rights:
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© 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. |
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Version:
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Published version |
