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A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode.

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A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode.

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Title: A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode.
Author: Kim, Tony Tae-Hyoung.; Liu, Jason.; Kim, Chris H.
Copyright year: 2009
Abstract: A voltage scalable 0.26 V, 64 kb 8T SRAM with 512 cells per bitline is implemented in a 130 nm CMOS process. Utilization of the reverse short channel effect in a SRAM cell design improves cell write margin and read performance without the aid of peripheral circuits. A marginal bitline leakage compensation (MBLC) scheme compensates for the bitline leakage current which becomes comparable to a read current at subthreshold supply voltages. The MBLC allows us to lower Vmin to 0.26 V and also eliminates the need for precharged read bitlines. A floating read bitline and write bitline scheme reduces the leakage power consumption. A deep sleep mode minimizes the standby leakage power consumption without compromising the hold mode cell stability. Finally, an automatic wordline pulse width control circuit tracks PVT variations and shuts off the bitline leakage current upon completion of a read operation.
Subject: DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems.
Type: Journal Article
Series/ Journal Title: IEEE journal of solid state circuits
School: School of Electrical and Electronic Engineering
Rights: © 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
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