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Silicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuits.

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Silicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuits.

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dc.contributor.author Kim, Tony Tae-Hyoung.
dc.contributor.author Persaud, Randy.
dc.contributor.author Kim, Chris H.
dc.date.accessioned 2010-08-20T01:53:30Z
dc.date.available 2010-08-20T01:53:30Z
dc.date.copyright 2008
dc.date.issued 2010-08-20T01:53:30Z
dc.identifier.citation Kim, T. H., Persaud, R., & Kim, C. H. (2008). Silicon odometer: an on-chip reliability monitor for measuring frequency degradation of digital circuits. IEEE Journal of Solid State Circuits. 43(4), 874-880.
dc.identifier.issn 0018-9200
dc.identifier.uri http://hdl.handle.net/10220/6327
dc.description.abstract Precise measurement of digital circuit degradation is a key aspect of aging tolerant digital circuit design. In this study, we present a fully digital on-chip reliability monitor for high-resolution frequency degradation measurements of digital circuits. The proposed technique measures the beat frequency of two ring oscillators, one stressed and the other unstressed, to achieve 50 X higher delay sensing resolution than that of prior techniques. The differential frequency measurement technique also eliminates the effect of common-mode environmental variation such as temperature drifts between each sampling points. A 265 X 132 mum square test chip implementing this design has been fabricated in a 1.2 V, 130 nm CMOS technology. The measured resolution of the proposed monitoring circuit was 0.02%, as the ring oscillator in this design has a period of 4 ns; this translates to a temporal resolution of 0.8 ps. The 2 mus measurement time was sufficiently short to suppress the unwanted recovery effect from concealing the actual circuit degradation.
dc.format.extent 7 p.
dc.language.iso en
dc.relation.ispartofseries IEEE journal of solid state circuits
dc.rights © 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
dc.subject DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits.
dc.title Silicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuits.
dc.type Journal Article
dc.contributor.school School of Electrical and Electronic Engineering
dc.identifier.doi http://dx.doi.org/10.1109/JSSC.2008.917502
dc.description.version Published version

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