| dc.contributor.author |
Chen, Shoushun. |
| dc.contributor.author |
Farid, Boussaid. |
| dc.contributor.author |
Amine, Bermak. |
| dc.date.accessioned |
2010-08-20T05:54:25Z |
| dc.date.available |
2010-08-20T05:54:25Z |
| dc.date.copyright |
2008 |
| dc.date.issued |
2010-08-20T05:54:25Z |
| dc.identifier.citation |
Chen, S. S., Farid, B., & Amine, B. (2008). Robust intermediate read-out for deep submicron technology CMOS image sensors. IEEE Sensors Journal, 8(3), 286-294. |
| dc.identifier.issn |
1530-437X |
| dc.identifier.uri |
http://hdl.handle.net/10220/6335 |
| dc.description.abstract |
In this paper, a CMOS image sensor featuring a novel
spiking pixel design and a robust digital intermediate read-out is
proposed for deep submicron CMOS technologies. The proposed
read-out scheme exhibits a relative insensitivity to the ongoing aggressive
scaling of the supply voltage. It is based on a novel compact
spiking pixel circuit, which combines digitizing and memory functions.
Illumination is encoded into a Gray code using a very simple
yet robust Gray 8-bit counter memory. Circuit simulations and experiments
demonstrate the successful operation of a 64 64 image
sensor, implemented in a 0.35 m CMOS technology. A scalability
analysis is presented. It suggests that deep sub-0.18 m will enable
the full potential of the proposed Gray encoding spiking pixel.
Potential applications include multiresolution imaging and motion
detection. |
| dc.format.extent |
9 p. |
| dc.language.iso |
en |
| dc.relation.ispartofseries |
IEEE sensors journal |
| dc.rights |
© 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. |
| dc.subject |
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems. |
| dc.title |
Robust intermediate read-out for deep submicron technology CMOS image sensors. |
| dc.type |
Journal Article |
| dc.contributor.school |
School of Electrical and Electronic Engineering |
| dc.identifier.doi |
http://dx.doi.org/10.1109/JSEN.2007.912783 |
| dc.description.version |
Published version |
