| dc.contributor.author |
Chang, Richard Weng Yew. |
| dc.contributor.author |
See, Kye Yak. |
| dc.contributor.author |
Bo, Hu. |
| dc.date.accessioned |
2010-08-30T09:03:36Z |
| dc.date.available |
2010-08-30T09:03:36Z |
| dc.date.copyright |
2008 |
| dc.date.issued |
2010-08-30T09:03:36Z |
| dc.identifier.citation |
Chang, R. W. Y., See, K. Y, & Bo, H. (2008). In-circuit impedance measurement based on a two-probe approach. In proceedings of the Electrical Design of Advanced Packaging and Systems Symposium: Seoul, South Korea, (pp.35-38). |
| dc.identifier.uri |
http://hdl.handle.net/10220/6370 |
| dc.description.abstract |
Most impedance measurement instruments usually
measure the impedance of a component or device under no-load
condition. Therefore, any non-linear behaviour and other onboard
circuit components or parasitic are not detected or taken
into consideration. Based on a novel two-probe measurement
technique, the impedance of any in-circuit component can be
measured with ease. Using the resistor characterization as a
preliminary study, the proposed technique is able to accurately
determine the impedance of the in-circuit resistor at the intended
operating condition up to 1 GHz. |
| dc.format.extent |
4 p. |
| dc.language.iso |
en |
| dc.rights |
© 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. |
| dc.subject |
DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials. |
| dc.title |
In-circuit impedance measurement based on a two-probe approach. |
| dc.type |
Conference Paper |
| dc.contributor.conference |
Electrical Design of Advanced Packaging and Systems Symposium (:2008:Seoul, South Korea) |
| dc.contributor.school |
School of Electrical and Electronic Engineering |
| dc.identifier.doi |
http://dx.doi.org/10.1109/EDAPS.2008.4735992 |
| dc.description.version |
Published version |
| dc.contributor.organization |
Guided Systems Division, DSO National Laboratories |
