mirage

In-circuit impedance measurement based on a two-probe approach

DSpace/Manakin Repository

 

Search DR-NTU


Advanced Search Subject Search

Browse

My Account

In-circuit impedance measurement based on a two-probe approach

Show simple item record

dc.contributor.author Chang, Richard Weng Yew
dc.contributor.author See, Kye Yak
dc.contributor.author Bo, Hu
dc.date.accessioned 2010-08-30T09:03:36Z
dc.date.available 2010-08-30T09:03:36Z
dc.date.copyright 2008
dc.date.issued 2010-08-30T09:03:36Z
dc.identifier.citation Chang, R. W. Y., See, K. Y, & Bo, H. (2008). In-circuit impedance measurement based on a two-probe approach. In proceedings of the Electrical Design of Advanced Packaging and Systems Symposium: Seoul, South Korea, (pp.35-38).
dc.identifier.uri http://hdl.handle.net/10220/6370
dc.description.abstract Most impedance measurement instruments usually measure the impedance of a component or device under no-load condition. Therefore, any non-linear behaviour and other on board circuit components or parasitic are not detected or taken into consideration. Based on a novel two-probe measurement technique, the impedance of any in-circuit component can be measured with ease. Using the resistor characterization as a preliminary study, the proposed technique is able to accurately determine the impedance of the in-circuit resistor at the intended operating condition up to 1 GHz.
dc.format.extent 4 p.
dc.language.iso en
dc.rights © 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
dc.subject DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials.
dc.title In-circuit impedance measurement based on a two-probe approach
dc.type Conference Paper
dc.contributor.conference Electrical Design of Advanced Packaging and Systems Symposium (2008 : Seoul, South Korea)
dc.contributor.school School of Electrical and Electronic Engineering
dc.identifier.doi http://dx.doi.org/10.1109/EDAPS.2008.4735992
dc.description.version Published version
dc.contributor.organization Guided Systems Division, DSO National Laboratories

Files in this item

Files Size Format View
In-circuit impe ... n a two-probe approach.pdf 724.5Kb PDF View/Open

This item appears in the following Collection(s)

Show simple item record

Statistics

Total views

All Items Views
In-circuit impedance measurement based on a two-probe approach 602

Total downloads

All Bitstreams Views
In-circuit impedance measurement based on a two-probe approach.pdf 305

Top country downloads

Country Code Views
United States of America 102
China 80
Singapore 46
India 9
Malaysia 8

Top city downloads

city Views
Mountain View 59
Beijing 55
Singapore 46
Kuala Lumpur 5
Austin 3

Downloads / month

  2014-09 2014-10 2014-11 total
In-circuit impedance measurement based on a two-probe approach.pdf 0 0 8 8