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Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

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Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

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dc.contributor.author Liu, Zhen
dc.contributor.author Chen, Tupei
dc.contributor.author Liu, Yang
dc.contributor.author Ding, Liang
dc.contributor.author Yang, Ming
dc.contributor.author Wong, Jen It
dc.contributor.author Cen, Zhan Hong
dc.contributor.author Li, Yibin
dc.contributor.author Zhang, Sam
dc.contributor.author Fung, Stevenson Hon Yuen
dc.date.accessioned 2010-09-06T01:13:47Z
dc.date.available 2010-09-06T01:13:47Z
dc.date.copyright 2008
dc.date.issued 2010-09-06T01:13:47Z
dc.identifier.citation Liu, Z., Chen, T. P., Liu, Y., Ding, L., Yang, M., Wong, J. I., et al. (2008). Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals. Applied Physics Letters, 92, 1-3.
dc.identifier.issn 0003-6951
dc.identifier.uri http://hdl.handle.net/10220/6402
dc.description.abstract Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc-Al/AlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination.
dc.format.extent 3 p.
dc.language.iso en
dc.relation.ispartofseries Applied physics letters
dc.rights Applied Physics Letters © copyright 2008 American Institute of Physics. The journal's website is located at http://apl.aip.org/applab/v92/i1/p013102_s1?isAuthorized=no
dc.subject DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
dc.title Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
dc.type Journal Article
dc.contributor.school School of Electrical and Electronic Engineering
dc.identifier.doi http://dx.doi.org/10.1063/1.2828691
dc.description.version Published version

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