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Charging effect on current conduction in aluminum nitride thin films containing Al nanocrystals

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Charging effect on current conduction in aluminum nitride thin films containing Al nanocrystals

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Title: Charging effect on current conduction in aluminum nitride thin films containing Al nanocrystals
Author: Liu, Yang; Chen, Tupei; Lau, Hon Wu; Wong, Jen It; Ding, Liang; Zhang, Sam; Fung, Stevenson Hon Yuen
Copyright year: 2006
Abstract: The presence of Al nanocrystals (nc-Al) in AlN thin films is found to enhance the current conduction of the thin film system greatly due to the formation of tunneling paths of nc-Al arrays, and the nc-Al/AlN system shows a quasi-two-dimensional transport following a power law. However, charge trapping in nc-Al reduces the current conduction because of the increase in the tunneling resistance and/or the breaking of some tunneling paths due to Coulomb blockade effect. The current conduction also evolves with a trend towards one-dimensional transport due to the breaking of some transverse tunneling paths as a result of the charge trapping.
Subject: DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics.
Type: Journal Article
Series/ Journal Title: Applied physics letters
School: School of Electrical and Electronic Engineering
Rights: Applied Physics Letters © copyright 2006 American Institute of Physics. The journal's website is located at http://apl.aip.org/applab/v89/i12/p123101_s1?isAuthorized=no
Version: Published version

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