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Surface contouring by optical edge projection based on a continuous wavelet transform

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Surface contouring by optical edge projection based on a continuous wavelet transform

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dc.contributor.author Quan, Chenggen
dc.contributor.author Miao, Hong
dc.contributor.author Fu, Yu
dc.date.accessioned 2010-11-23T08:13:04Z
dc.date.available 2010-11-23T08:13:04Z
dc.date.copyright 2006
dc.date.issued 2010-11-23T08:13:04Z
dc.identifier.citation Quan, C., Miao, H., & Fu, Y. (2006). Surface contouring by optical edge projection based on a continuous wavelet transform. Applied Optics, 45(20), 4815-4820.
dc.identifier.issn 0003-6935
dc.identifier.uri http://hdl.handle.net/10220/6469
dc.description.abstract A novel optical edge projection method for surface contouring of an object with low reflectivity is presented. A structured light edge is projected onto a dark surface, and the image is captured by a CCD camera. The surface profile of the object is then evaluated by an active triangular projection technique, and a whole-field three-dimensional contour of the object is obtained by scanning the optical edge over the entire object surface. An edge detection method based on a continuous wavelet transform (CWT) is employed to determine the location of the optical edge. The method of optical edge detection is described, and characteristic details of gray-level distribution along the edge are analyzed. It is shown that the proposed wavelet edge detection method is not dependent on any threshold values; hence the true edge position can be determined without subjective selection. A black low-reflectivity object surface made from woven carbon fiber is measured, and the experimental results show that the profile of a woven carbon fiber can be obtained by the proposed method.
dc.format.extent 6 p.
dc.language.iso en
dc.relation.ispartofseries Applied Optics
dc.rights This paper was published in [Applied Optics] and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: [http://www.opticsinfobase.org/abstract.cfm?URI=ao-45-20-4815]. Systematic or multiple reproduction or distribution to multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
dc.subject DRNTU::Science::Physics::Optics and light.
dc.title Surface contouring by optical edge projection based on a continuous wavelet transform
dc.type Journal Article
dc.contributor.research Temasek Laboratories
dc.identifier.doi http://dx.doi.org/10.1364/AO.45.004815
dc.description.version Published version

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