mirage

Phase extraction from electronic speckle patterns by statistical analysis

DSpace/Manakin Repository

 

Search DR-NTU


Advanced Search Subject Search

Browse

My Account

Phase extraction from electronic speckle patterns by statistical analysis

Show simple item record

dc.contributor.author Tay, Cho Jui
dc.contributor.author Quan, Chenggen
dc.contributor.author Chen, Lujie
dc.contributor.author Fu, Yu
dc.date.accessioned 2011-01-26T03:34:13Z
dc.date.available 2011-01-26T03:34:13Z
dc.date.copyright 2004
dc.date.issued 2011-01-26T03:34:13Z
dc.identifier.citation Tay, C. J., Quan, C., Chen, L., & Fu, Y. (2004). Phase extraction from electronic speckle patterns by statistical analysis. Optics Communications, 236(4-6), 259-269.
dc.identifier.issn 0030-4018
dc.identifier.uri http://hdl.handle.net/10220/6705
dc.description.abstract In electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random variable having a uniform distribution, the grey level variance of a number of pixels is found to be related to the modulation intensity of a speckle pattern. The relation is used to establish a connection between the phase to be measured and the variance of grey level difference between two speckle patterns. Subsequently, a phase map wrapped in [0,π) is extracted. In order to obtain a standard 2π wrapped phase map, an initial one step phase shift is introduced. The phase value of a pixel under consideration is obtained from the grey levels of its N×N neighbouring pixels. The optimal value of N is obtained based on a qualitative analysis of the initial results. With an appropriate value of N, an accuracy of 1% can be achieved.
dc.format.extent 23 p.
dc.language.iso en
dc.relation.ispartofseries Optics communications
dc.rights This is the author created version of a work that has been peer reviewed and accepted for publication by Optics Communications, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [DOI:http://dx.doi.org/10.1016/j.optcom.2004.03.039].
dc.subject DRNTU::Science::Physics::Optics and light.
dc.title Phase extraction from electronic speckle patterns by statistical analysis
dc.type Journal Article
dc.contributor.research Temasek Laboratories
dc.identifier.doi http://dx.doi.org/10.1016/j.optcom.2004.03.039
dc.description.version Accepted version

Files in this item

Files Size Format View
Phase extractio ... y statistical analysis.pdf 1.679Mb PDF View/Open

This item appears in the following Collection(s)

Show simple item record

Statistics

Total views

All Items Views
Phase extraction from electronic speckle patterns by statistical analysis 432

Total downloads

All Bitstreams Views
Phase extraction from electronic speckle patterns by statistical analysis.pdf 309

Top country downloads

Country Code Views
United States of America 128
China 66
Singapore 48
France 6
Russian Federation 6

Top city downloads

city Views
Mountain View 113
Singapore 47
Beijing 25
Alexandria 4
Bandung 4