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Title:
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Charge transfer dynamics in Cu-doped ZnO nanowires.
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Author:
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Xing, Guozhong.; Xing, Guichuan.; Li, Mingjie.; Sie, Edbert Jarvis.; Wang, Dandan.; Sulistio, Arief.; Ye, Quan Lin.; Huan, Alfred Cheng Hon.; Wu, Tom.; Sum, Tze Chien.
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Copyright year:
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2011 |
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Abstract:
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Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an
ultrafast charge transfer (CT) process, with an electron localization time constant 39+-9 ps,
between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively
competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission.
TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related
green emission. TA measurements probing the state-filling of the band edge and defect states
provide further support to the CT model where the bleaching dynamics concur with the TRPL
lifetimes. |
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Subject:
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DRNTU::Science::Chemistry::Physical chemistry. |
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Type:
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Journal Article |
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Series/ Journal Title:
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Applied physics letters |
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School:
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School of Physical and Mathematical Sciences |
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Rights:
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© 2011 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.3558912. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. |
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Version:
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Published version |
