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Title:
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Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films.
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Author:
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Ma, Hua.; Chen, Lang.; Wang, Junling.; Ma, Jan.; Boey, Freddy Yin Chiang.
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Copyright year:
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2008 |
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Abstract:
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A “misfit strain-temperature” phase diagram for BiFeO3 thin film was constructed based on the
Landau–Devonshire theory with the mechanical substrate effect. It is found that the polarization
instabilities result in the formation of the monoclinic phases in BiFeO3 thin films. The effective
substrate lattice parameter has been introduced to calculate the film thickness dependence of the
polarization and the dielectric constants. The theoretical results are in agreement with the
experimental data for the thickness dependence of ferroelectric properties of the BiFeO3 epitaxial
thin films on SrTiO3 and Si substrates. |
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Subject:
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DRNTU::Engineering::Materials::Magnetic materials.
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films.
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Type:
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Journal Article |
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Series/ Journal Title:
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Applied physics letters |
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School:
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School of Materials Science and Engineering |
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Rights:
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© 2008 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.2920192. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. |
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Version:
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Published version |
