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Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films

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Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films

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dc.contributor.author Ma, Hua
dc.contributor.author Chen, Lang
dc.contributor.author Wang, Junling
dc.contributor.author Ma, Jan
dc.contributor.author Boey, Freddy Yin Chiang
dc.date.accessioned 2011-07-19T06:38:06Z
dc.date.available 2011-07-19T06:38:06Z
dc.date.copyright 2008
dc.date.issued 2011-07-19
dc.identifier.citation Ma, H., Chen, L., Wang, J., Ma, J., & Boey, F. (2008). Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films. Applied Physics Letters, 92.
dc.identifier.uri http://hdl.handle.net/10220/6927
dc.description.abstract A “misfit strain-temperature” phase diagram for BiFeO3 thin film was constructed based on the Landau–Devonshire theory with the mechanical substrate effect. It is found that the polarization instabilities result in the formation of the monoclinic phases in BiFeO3 thin films. The effective substrate lattice parameter has been introduced to calculate the film thickness dependence of the polarization and the dielectric constants. The theoretical results are in agreement with the experimental data for the thickness dependence of ferroelectric properties of the BiFeO3 epitaxial thin films on SrTiO3 and Si substrates.
dc.format.extent 3 p.
dc.language.iso en
dc.relation.ispartofseries Applied physics letters
dc.rights © 2008 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.2920192. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
dc.subject DRNTU::Engineering::Materials::Magnetic materials
dc.subject DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
dc.title Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1063/1.2920192
dc.description.version Published version

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