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Title:
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Nanoscale domains in strained epitaxial BiFeO3 thin Films on LaSrAlO4 substrate.
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Author:
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Chen, Zuhuang.; You, Lu.; Huang, Chuanwei.; Qi, Yajun.; Wang, Junling.; Sritharan, Thirumany.; Chen, Lang.
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Copyright year:
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2010 |
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Abstract:
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BiFeO3 thin films with various thicknesses were grown epitaxially on (001) LaSrAlO4 single crystal substrates using pulsed laser deposition. High resolution x-ray diffraction measurements revealed that a tetragonal-like phase with c-lattice constant -4.65 Å is stabilized by a large misfit strain. Besides, a rhombohedral-like phase with c-lattice constant -3.99 Å was also detected at film thickness of -50 nm and above to relieve large misfit strains. In-plane piezoelectric force microscopy studies showed clear signals and self-assembled nanoscale stripe domain structure for the tetragonal-like regions. These findings suggest a complex picture of nanoscale domain patterns in BiFeO3 thin films subjected to large compressive strains. |
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Subject:
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DRNTU::Engineering::Materials::Magnetic materials.
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films.
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Type:
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Journal Article |
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Series/ Journal Title:
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Applied physics letters |
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School:
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School of Materials Science and Engineering |
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Rights:
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© 2010 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.3456729. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. |
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Version:
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Published version |
