| dc.contributor.author |
Patra, Jagdish Chandra. |
| dc.contributor.author |
Ang, Ee Luang. |
| dc.contributor.author |
Chaudhari, Narendra Shivaji. |
| dc.contributor.author |
Das, Amitabha. |
| dc.date.accessioned |
2011-09-29T03:10:05Z |
| dc.date.available |
2011-09-29T03:10:05Z |
| dc.date.copyright |
2005 |
| dc.date.issued |
2011-09-29 |
| dc.identifier.citation |
Patra, J. C., Ang, E. L., Chaudhari, N. S., & Das, A. (2005). Neural-Network-Based Smart Sensor Framework Operating in a Harsh Environment. EURASIP Journal on Applied Signal Processing, 2005(4), 558-574. |
| dc.identifier.issn |
1110-8657 |
| dc.identifier.uri |
http://hdl.handle.net/10220/7115 |
| dc.description.abstract |
We present an artificial neural-network- (NN-) based smart interface framework for sensors operating in harsh environments. The NN-based sensor can automatically compensate for the nonlinear response characteristics and its nonlinear dependency on the environmental parameters, with high accuracy. To show the potential of the proposed NN-based framework, we provide results of a smart capacitive pressure sensor (CPS) operating in a wide temperature range of 0 to 250° C. Through simulated experiments, we have shown that the NN-based CPS model is capable of providing pressure readout with a maximum full-scale (FS) error of only ±1.0% over this temperature range. A novel scheme for estimating the ambient temperature from the sensor characteristics itself is proposed. For this purpose, a second NN is utilized to estimate the ambient temperature accurately from the knowledge of the offset capacitance of the CPS. A microcontroller-unit- (MCU-) based implementation scheme is also provided. |
| dc.format.extent |
28 p. |
| dc.language.iso |
en |
| dc.relation.ispartofseries |
EURASIP journal on applied signal processing |
| dc.rights |
© 2005 Jagdish C. Patra et al. |
| dc.subject |
DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation. |
| dc.title |
Neural-network-based smart sensor framework operating in a harsh environment. |
| dc.type |
Journal Article |
| dc.contributor.school |
School of Computer Engineering |
| dc.identifier.doi |
http://dx.doi.org/10.1155/ASP.2005.558 |
| dc.description.version |
Published version |
| dc.identifier.rims |
128721 |