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Amplitude contrast image enhancement in digital holography for particles analysis.

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Amplitude contrast image enhancement in digital holography for particles analysis.

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dc.contributor.author Singh, Vijay Raj.
dc.contributor.author Asundi, Anand Krishna.
dc.date.accessioned 2011-10-10T06:00:34Z
dc.date.available 2011-10-10T06:00:34Z
dc.date.copyright 2005
dc.date.issued 2011-10-10
dc.identifier.citation Singh, V. R., & Asundi, A. K. (2005). Amplitude contrast image enhancement in digital holography for particles analysis. Paper presented at the Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies.
dc.identifier.uri http://hdl.handle.net/10220/7191
dc.description.abstract In-line digital holography is presented for the particles analysis in 3-D. The presence of zero order wave, conjugate image wave, and defocused images degrade the image quality in in-line digital holography. In this paper we utilise the numerical reconstruction process to minimise these effects. We present a new subtraction method of reconstructed wave fields for particles analysis. The effects of zero order term, conjugate image wave and more importantly the particles outside the plane of interest (defocused images) are simultaneously minimized, and thus improve the contrast of reconstructed amplitude images. This method is useful to slice in-line digital holograms to display only in-focus particles at any particular plane. Furthermore all this is accomplished from a single hologram with no additional pre or post processing required.
dc.format.extent 8 p.
dc.language.iso en
dc.rights © 2005 SPIE. This paper was published in Proc. SPIE 5878 and is made available as an electronic reprint (preprint) with permission of SPIE. The paper can be found at: [DOI: http://dx.doi.org/10.1117/12.613297].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
dc.subject DRNTU::Science::Physics::Optics and light.
dc.title Amplitude contrast image enhancement in digital holography for particles analysis.
dc.type Conference Paper
dc.contributor.conference Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies (2nd : 2005 : San Diego)
dc.contributor.school School of Mechanical and Aerospace Engineering
dc.identifier.doi http://dx.doi.org/10.1117/12.613297
dc.description.version Published version
dc.identifier.rims 143375

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