An examination of variability and its basic properties for a factory

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An examination of variability and its basic properties for a factory

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Title: An examination of variability and its basic properties for a factory
Author: Wu, Kan
Copyright year: 2005
Abstract: Variability is a key performance index of a factory. In order to characterize variability of a factory, definitions of bottleneck, utilization, and variability of a single machine are reexamined and clarified. The clarification leads to the introduction of a detail expression for the relationship between cycle time and work-in-progress. In order to quantify variability for factories, the author uses a single machine system to gauge the behaviors, and subsequently derives an explicit expression for the variability, of a simple factory, making use of analogy and the clarified definitions. The obtained results can be applied to many subjects in the field of manufacturing management, such as factory performance analysis, capacity planning, and cycle time reduction. With the derived results, properties of variability for a simple factory in the aspects of utilization versus throughput bottlenecks and nonthroughput bottlenecks, gap effects, and bounds on variability, are examined in detail to shed light on the insights of the stochastic behaviors of a complex factory.
Subject: DRNTU::Engineering::Industrial engineering::Operations research.DRNTU::Engineering::Industrial engineering::Supply chain.
Type: Journal Article
Series/ Journal Title: IEEE transactions on semiconductor manufacturing
School: School of Mechanical and Aerospace Engineering
Rights: © 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [DOI: http://dx.doi.org/10.1109/TSM.2004.840525].
Version: Accepted version

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