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Characterization of MEMS cantilevers using lensless digital holographic microscope.

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Characterization of MEMS cantilevers using lensless digital holographic microscope.

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Title: Characterization of MEMS cantilevers using lensless digital holographic microscope.
Author: Andrei, Alexandru.; Gorecki, Cristophe.; Nieradko, Lukasz.; Singh, Vijay Raj.; Anand, Asundi.
Copyright year: 2008
Abstract: In this paper vibration characterization of MEMS cantilevers are presented using lens-less in-line digital holographic microscope (LDHM). In-line digital holography provides larger information capability with higher phase sensitivity, and full CCD sensor area is utilized for real image reconstruction. In lensless in-line digital holographic microscope, a highly diverging beam replaces the conventional microscope objectives to provide the required magnification. The diverging wave geometry also reduces the effect of twin-image wave caused by the in-line holographic geometry. For vibration analysis, the time averaged holograms were recorded corresponding to different vibration states of the cantilevers. Direct numerical evaluation of the amplitude and phase information from single time averaged hologram provides the full-field real time quantitative analysis. The experimental study of vibration measurements of Aluminum nitride (AlN) driven cantilevers is performed. The full field study shows the simultaneous vibration behavior of many cantilevers corresponding to same input conditions. Our study shows the shift in the resonant condition of cantilevers both for first and second resonant frequencies. This kind of analysis is most suitable to optimize and monitoring the fabrication process of cantilevers.
Subject: DRNTU::Engineering::Electrical and electronic engineering::Microelectromechanical systems.
Type: Conference Paper
Conference name: Optical Micro- and Nanometrology in Microsystems Technology (2nd : 2008 : Strasbourg, France)
School: School of Mechanical and Aerospace Engineering
Rights: © 2008 SPIE.  This is the author created version of a work that has been peer reviewed and accepted for publication by Optical Micro- and Nanometrology in Microsystems Technology II, SPIE.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at: http://dx.doi.org/10.1117/12.782981.
Version: Accepted version

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