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Characterization of MEMS cantilevers using lensless digital holographic microscope.

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Characterization of MEMS cantilevers using lensless digital holographic microscope.

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dc.contributor.author Andrei, Alexandru.
dc.contributor.author Gorecki, Cristophe.
dc.contributor.author Nieradko, Lukasz.
dc.contributor.author Singh, Vijay Raj.
dc.contributor.author Anand, Asundi.
dc.date.accessioned 2011-10-12T04:15:39Z
dc.date.available 2011-10-12T04:15:39Z
dc.date.copyright 2008
dc.date.issued 2011-10-12
dc.identifier.citation Andrei, A., Gorecki, C., Nieradko, L., Singh, V. R., & Anand, A. (2008). Characterization of MEMS cantilevers using lensless digital holographic microscope. Optical Micro- and Nanometrology in Microsystems Technology II, 6995.
dc.identifier.uri http://hdl.handle.net/10220/7239
dc.description.abstract In this paper vibration characterization of MEMS cantilevers are presented using lens-less in-line digital holographic microscope (LDHM). In-line digital holography provides larger information capability with higher phase sensitivity, and full CCD sensor area is utilized for real image reconstruction. In lensless in-line digital holographic microscope, a highly diverging beam replaces the conventional microscope objectives to provide the required magnification. The diverging wave geometry also reduces the effect of twin-image wave caused by the in-line holographic geometry. For vibration analysis, the time averaged holograms were recorded corresponding to different vibration states of the cantilevers. Direct numerical evaluation of the amplitude and phase information from single time averaged hologram provides the full-field real time quantitative analysis. The experimental study of vibration measurements of Aluminum nitride (AlN) driven cantilevers is performed. The full field study shows the simultaneous vibration behavior of many cantilevers corresponding to same input conditions. Our study shows the shift in the resonant condition of cantilevers both for first and second resonant frequencies. This kind of analysis is most suitable to optimize and monitoring the fabrication process of cantilevers.
dc.format.extent 8 p.
dc.language.iso en
dc.rights © 2008 SPIE.  This is the author created version of a work that has been peer reviewed and accepted for publication by Optical Micro- and Nanometrology in Microsystems Technology II, SPIE.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at: http://dx.doi.org/10.1117/12.782981.
dc.subject DRNTU::Engineering::Electrical and electronic engineering::Microelectromechanical systems.
dc.title Characterization of MEMS cantilevers using lensless digital holographic microscope.
dc.type Conference Paper
dc.contributor.conference Optical Micro- and Nanometrology in Microsystems Technology (2nd : 2008 : Strasbourg, France)
dc.contributor.school School of Mechanical and Aerospace Engineering
dc.identifier.doi http://dx.doi.org/10.1117/12.782981
dc.description.version Accepted version
dc.identifier.rims 143362

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