mirage

Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization.

DSpace/Manakin Repository

 

Search DR-NTU


Advanced Search Subject Search

Browse

My Account

Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization.

Show simple item record

dc.contributor.author Infante, F.
dc.contributor.author Perdu, P.
dc.contributor.author Kor, H. B.
dc.contributor.author Gan, C. L.
dc.contributor.author Lewis, D.
dc.date.accessioned 2011-10-12T06:17:17Z
dc.date.available 2011-10-12T06:17:17Z
dc.date.copyright 2011
dc.date.issued 2011-10-12
dc.identifier.citation Infante, F., Perdu, P., Kor, H. B., Gan, C. L., & Lewis, D. (2011). Magnetic field spatial Fourier analysis: a new opportunity for high resolution current localization. Microelectronics Reliability, 51 (9-11).
dc.identifier.issn 0026-2714
dc.identifier.uri http://hdl.handle.net/10220/7243
dc.description.abstract Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to obtain a stable solution, the magnetic data is severely low-pass filtered in the spatial Fourier domain, and some important information is lost. In this paper, the contribution given by the different spatial frequencies was studied: it was demonstrated how this information can be used to obtain additional information regarding the position of the currents. A comparative study between the theoretical approach and the application to the measurements is also shown.
dc.format.extent 7 p.
dc.language.iso en
dc.relation.ispartofseries Microelectronics reliability
dc.rights © 2011 Elsevier.This is the author created version of a work that has been peer reviewed and accepted for publication by Microelectronics Reliability, Elsevier.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at: http://dx.doi.org/10.1016/j.microrel.2011.07.076.
dc.subject DRNTU::Engineering::Materials::Microelectronics and semiconductor materials.
dc.title Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization.
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1016/j.microrel.2011.07.076
dc.description.version Accepted version
dc.identifier.rims 161599

Files in this item

Files Size Format View
ESREF_2011FI_v11.pdf 520.9Kb PDF View/Open

This item appears in the following Collection(s)

Show simple item record

Statistics

Total views

All Items Views
Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization. 376

Total downloads

All Bitstreams Views
ESREF_2011FI_v11.pdf 159

Top country downloads

Country Code Views
China 57
United States of America 54
Singapore 24
Japan 5
Iran 4

Top city downloads

city Views
Mountain View 39
Beijing 34
Singapore 24
Shenzhen 3
San Francisco 2

Downloads / month

  2014-06 2014-07 2014-08 total
ESREF_2011FI_v11.pdf 0 0 3 3