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Title:
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Nanoscale polarization relaxation of epitaxial BiFeO3 thin film.
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Author:
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Chen, Weigang.; You, Lu.; Chen, Gaofeng.; Chua, Ngeah Theng.; Guan, Ong Hock.; Zou, Xi.; Wang, Junling.; Chen, Lang.
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Copyright year:
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2010 |
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Abstract:
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The polarization relaxation phenomena in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e^(-k(t-t0)^n) with parameters t0 = 2894 s, n =0.50 and k =6.04e-4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation. |
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Subject:
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DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films. |
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Type:
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Journal Article |
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Series/ Journal Title:
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Thin solid films |
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School:
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School of Materials Science and Engineering |
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Rights:
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© 2010 Elsevier This is the author created version of a work that has been peer reviewed and accepted for publication by Nanoscale polarization relaxation of epitaxial BiFeO3 thin film, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: http://dx.doi.org/10.1016/j.tsf.2010.03.089 |
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Version:
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Accepted version |
