Nanoscale polarization relaxation of epitaxial BiFeO3 thin film

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Nanoscale polarization relaxation of epitaxial BiFeO3 thin film

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Title: Nanoscale polarization relaxation of epitaxial BiFeO3 thin film
Author: Chen, Weigang; You, Lu; Chen, Gaofeng; Chua, Ngeah Theng; Guan, Ong Hock; Zou, Xi; Wang, Junling; Chen, Lang
Copyright year: 2010
Abstract: The polarization relaxation phenomena in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e^(-k(t-t0)^n) with parameters t0 = 2894 s, n =0.50 and k =6.04e-4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation.
Subject: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films.
Type: Journal Article
Series/ Journal Title: Thin solid films
School: School of Materials Science and Engineering
Rights: © 2010 Elsevier  This is the author created version of a work that has been peer reviewed and accepted for publication by Nanoscale polarization relaxation of epitaxial BiFeO3 thin film, Elsevier.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at: http://dx.doi.org/10.1016/j.tsf.2010.03.089
Version: Accepted version

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