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Nanoscale polarization relaxation of epitaxial BiFeO3 thin film.

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Nanoscale polarization relaxation of epitaxial BiFeO3 thin film.

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dc.contributor.author Chen, Weigang.
dc.contributor.author You, Lu.
dc.contributor.author Chen, Gaofeng.
dc.contributor.author Chua, Ngeah Theng.
dc.contributor.author Guan, Ong Hock.
dc.contributor.author Zou, Xi.
dc.contributor.author Wang, Junling.
dc.contributor.author Chen, Lang.
dc.date.accessioned 2011-12-15T06:07:47Z
dc.date.available 2011-12-15T06:07:47Z
dc.date.copyright 2010
dc.date.issued 2011-12-15
dc.identifier.citation Chen, W., You, L., Chen, G., Chua, N. T., Guan, O. H., Zou, X., & et al. (2010). Nanoscale polarization relaxation of epitaxial BiFeO3 thin film. Thin Solid Films, 518(24), 169-173.
dc.identifier.uri http://hdl.handle.net/10220/7400
dc.description.abstract The polarization relaxation phenomena in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e^(-k(t-t0)^n) with parameters t0 = 2894 s, n =0.50 and k =6.04e-4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation.
dc.language.iso en
dc.relation.ispartofseries Thin solid films
dc.rights © 2010 Elsevier  This is the author created version of a work that has been peer reviewed and accepted for publication by Nanoscale polarization relaxation of epitaxial BiFeO3 thin film, Elsevier.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at: http://dx.doi.org/10.1016/j.tsf.2010.03.089
dc.subject DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films.
dc.title Nanoscale polarization relaxation of epitaxial BiFeO3 thin film.
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1016/j.tsf.2010.03.089
dc.description.version Accepted version

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