Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/94379
Title: | Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials | Authors: | Schenk, John O. Fiddy, Michael A. Zhang, Yuan Chuang, Yi-Chen |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2011 | Source: | Zhang, Y., Chuang, Y. C., Schenk, J. O., & Fiddy, M. A. (2011). Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials. Applied Physics A: Materials Science & Processing, 107(1), 61-69. | Series/Report no.: | Applied physics A: materials science & processing | Abstract: | A metamaterial slab, used as a superlens in a subwavelength imaging system, is frequently assumed homogeneous. It is the bulk properties of the metamaterial which are responsible for the resolution of the transferred information in the image domain, as a result of high transverse wave-vector coupling. However, how in a discretized metamaterial, individual meta-atoms (i.e., the meta-elements composing a negative index metamaterial slab) contribute to the imaging process is still actively studied. The main aim of this paper is to investigate the consequences of using only a few meta-atoms as a negative index slab-equivalent for subwavelength scale imaging. We make a specific choice for a meta-atom and investigate its resonant scattering patterns. We report on how knowledge of these 3D scattering patterns provides a means to understand the transfer of high spatial frequencies and assist with the design an improved negative index slab. | URI: | https://hdl.handle.net/10356/94379 http://hdl.handle.net/10220/7815 |
ISSN: | 0947-8396 | DOI: | 10.1007/s00339-011-6738-9 | Schools: | School of Electrical and Electronic Engineering | Organisations: | Electromagnetics Academy at Zhejiang University, China Centre for Optoelectronics and Optical Communications, Univ. of North Carolina at Charlotte, USA |
Rights: | © Springer-Verlag 2011. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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