| dc.contributor.author |
Zhang, Yuan. |
| dc.contributor.author |
Chuang, Yi-Chen. |
| dc.contributor.author |
Schenk, John O. |
| dc.contributor.author |
Fiddy, Michael A. |
| dc.date.accessioned |
2012-05-04T08:04:37Z |
| dc.date.available |
2012-05-04T08:04:37Z |
| dc.date.copyright |
2011 |
| dc.date.issued |
2012-05-04 |
| dc.identifier.citation |
Zhang, Y., Chuang, Y. C., Schenk, J. O., & Fiddy, M. A. (2011). Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials. Applied Physics A: Materials Science & Processing, 107(1), 61-69. |
| dc.identifier.issn |
0947-8396 |
| dc.identifier.uri |
http://hdl.handle.net/10220/7815 |
| dc.description.abstract |
A metamaterial slab, used as a superlens in a subwavelength imaging system, is frequently assumed homogeneous. It is the bulk properties of the metamaterial which are responsible for the resolution of the transferred information in the image domain, as a result of high transverse wave-vector coupling. However, how in a discretized metamaterial, individual meta-atoms (i.e., the meta-elements composing a negative index metamaterial slab) contribute to the imaging process is still actively studied. The main aim of this paper is to investigate the consequences of using only a few meta-atoms as a negative index slab-equivalent for subwavelength scale imaging. We make a specific choice for a meta-atom and investigate its resonant scattering patterns. We report on how knowledge of these 3D scattering patterns provides a means to understand the transfer of high spatial frequencies and assist with the design an improved negative index slab. |
| dc.format.extent |
12 p. |
| dc.language.iso |
en |
| dc.relation.ispartofseries |
Applied physics A: materials science & processing |
| dc.rights |
© Springer-Verlag 2011. |
| dc.subject |
DRNTU::Engineering::Electrical and electronic engineering. |
| dc.title |
Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials. |
| dc.type |
Journal Article |
| dc.contributor.school |
School of Electrical and Electronic Engineering |
| dc.identifier.doi |
http://dx.doi.org/10.1007/s00339-011-6738-9 |
| dc.contributor.organization |
Electromagnetics Academy at Zhejiang University, China |
| dc.contributor.organization |
Center for Optoelectronics and Optical Communications, Univ. of North Carolina at Charlotte, USA |
