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Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials

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Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials

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dc.contributor.author Zhang, Yuan
dc.contributor.author Chuang, Yi-Chen
dc.contributor.author Schenk, John O.
dc.contributor.author Fiddy, Michael A.
dc.date.accessioned 2012-05-04T08:04:37Z
dc.date.available 2012-05-04T08:04:37Z
dc.date.copyright 2011
dc.date.issued 2012-05-04
dc.identifier.citation Zhang, Y., Chuang, Y. C., Schenk, J. O., & Fiddy, M. A. (2011). Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials. Applied Physics A: Materials Science & Processing, 107(1), 61-69.
dc.identifier.issn 0947-8396
dc.identifier.uri http://hdl.handle.net/10220/7815
dc.description.abstract A metamaterial slab, used as a superlens in a subwavelength imaging system, is frequently assumed homogeneous. It is the bulk properties of the metamaterial which are responsible for the resolution of the transferred information in the image domain, as a result of high transverse wave-vector coupling. However, how in a discretized metamaterial, individual meta-atoms (i.e., the meta-elements composing a negative index metamaterial slab) contribute to the imaging process is still actively studied. The main aim of this paper is to investigate the consequences of using only a few meta-atoms as a negative index slab-equivalent for subwavelength scale imaging. We make a specific choice for a meta-atom and investigate its resonant scattering patterns. We report on how knowledge of these 3D scattering patterns provides a means to understand the transfer of high spatial frequencies and assist with the design an improved negative index slab.
dc.format.extent 12 p.
dc.language.iso en
dc.relation.ispartofseries Applied physics A: materials science & processing
dc.rights © Springer-Verlag 2011.
dc.subject DRNTU::Engineering::Electrical and electronic engineering
dc.title Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials
dc.type Journal Article
dc.contributor.school School of Electrical and Electronic Engineering
dc.identifier.doi http://dx.doi.org/10.1007/s00339-011-6738-9
dc.contributor.organization Electromagnetics Academy at Zhejiang University, China
dc.contributor.organization Centre for Optoelectronics and Optical Communications, Univ. of North Carolina at Charlotte, USA

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