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Pyramidal structural defects in erbium silicide thin films.

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Pyramidal structural defects in erbium silicide thin films.

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dc.contributor.author Tan, Eu Jin.
dc.contributor.author Bouville, Mathieu.
dc.contributor.author Chi, Dong Zhi.
dc.contributor.author Pey, Kin Leong.
dc.contributor.author Lee, Pooi See.
dc.contributor.author Srolovitz, David J.
dc.contributor.author Tung, Chih Hang.
dc.date.accessioned 2012-05-17T07:18:20Z
dc.date.available 2012-05-17T07:18:20Z
dc.date.copyright 2006
dc.date.issued 2012-05-17
dc.identifier.citation Tan, E. J., Bouville, M., Chi, D. Z., Pey, K. L., Lee, P. S., Srolovitz, D. J., et al. (2006). Pyramidal structural defects in Erbium silicide thin films. Applied Physics Letters, 88(2).
dc.identifier.uri http://hdl.handle.net/10220/8074
dc.description.abstract Pyramidal structural defects, 5–8 μm wide, have been discovered in thin films of epitaxial ErSi2−x formed by annealing thin Er films on Si(001) substrates at temperatures of 500–800 °C. The formation of these defects is not due to oxidation. We propose that they form as a result of the separation of the silicide film from the substrate and its buckling in order to relieve the compressive, biaxial epitaxial stresses. Silicon can then diffuse through the silicide or along the interface to fully or partially fill the void between the buckled erbium disilicide film and the substrate.
dc.format.extent 3 p.
dc.language.iso en
dc.relation.ispartofseries Applied physics letters
dc.rights © 2006 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official URL: http://dx.doi.org/10.1063/1.2162862. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
dc.subject DRNTU::Engineering::Materials.
dc.title Pyramidal structural defects in erbium silicide thin films.
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1063/1.2162862
dc.description.version Published version

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