mirage

Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes.

DSpace/Manakin Repository

 

Search DR-NTU


Advanced Search Subject Search

Browse

My Account

Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes.

Show simple item record

dc.contributor.author Chi, Dong Zhi.
dc.contributor.author Mangelinck, D.
dc.contributor.author Lahiri, S. K.
dc.contributor.author Lee, Pooi See.
dc.contributor.author Pey, Kin Leong.
dc.date.accessioned 2012-05-18T08:05:29Z
dc.date.available 2012-05-18T08:05:29Z
dc.date.copyright 2001
dc.date.issued 2012-05-18
dc.identifier.citation Chi, D. Z., Mangelick, D., Lahiri, S. K., Lee, P. S., & Pey, K. L. (2001). Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes. Applied Physics Letters, 78(21), 3256-3258.
dc.identifier.uri http://hdl.handle.net/10220/8105
dc.description.abstract A comparative study of the I –V characteristics of p+/n diodes silicided with a pure Ni and Ni(Pt) alloy has been performed. Higher saturation currents as well as abnormal reverse I –V characteristics were observed for some of the diodes which were silicided with pure Ni at 700 °C while good I –V characteristics were observed for other diodes. Our results show that the forward current in the diodes with good I –V characteristics is dominated by electron diffusion in the p+ region. For diodes with higher saturation currents, it has been concluded that both forward and reverse currents in these diodes are dominated by the current following through Schottky contacts that are formed due to inadvertent penetration of NiSi spikes through the p1 region into n region. The formation of Schottky contact was not observed in diodes silicided with a Ni(Pt) alloy, providing a clear evidence of enhanced thermal stability of Pt containing NiSi.
dc.format.extent 3 p.
dc.language.iso en
dc.relation.ispartofseries Applied physics letters
dc.rights © 2001 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official URL: http://dx.doi.org/10.1063/1.1374496. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
dc.subject DRNTU::Engineering::Materials::Microelectronics and semiconductor materials.
dc.title Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes.
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1063/1.1374496
dc.description.version Published version

Files in this item

Files Size Format View
107. A comparat ... i(Pt)- alloy silicided.pdf 73.91Kb PDF View/Open

This item appears in the following Collection(s)

Show simple item record

Statistics

Total views

All Items Views
Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes. 239

Total downloads

All Bitstreams Views
107. A comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided.pdf 133

Top country downloads

Country Code Views
United States of America 43
China 37
Singapore 24
Russian Federation 4
Unknown Country 3

Top city downloads

city Views
Mountain View 34
Singapore 23
Beijing 20
Abu Dhabi 2
Scranton 2