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Improved electrical performance of Erbium silicide Schottky diodes formed by pre-RTA amorphization of Si

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Improved electrical performance of Erbium silicide Schottky diodes formed by pre-RTA amorphization of Si

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dc.contributor.author Tan, Eu Jin
dc.contributor.author Pey, Kin Leong
dc.contributor.author Chi, Dong Zhi
dc.contributor.author Lee, Pooi See
dc.contributor.author Tang, L. J.
dc.date.accessioned 2012-07-26T00:57:31Z
dc.date.available 2012-07-26T00:57:31Z
dc.date.copyright 2006
dc.date.issued 2012-07-26
dc.identifier.citation Tan, E. J., Pey, K. L., Chi, D. Z., Lee, P. S., & Tang, L. J. (2006). Improved Electrical Performance of Erbium Silicide Schottky Diodes formed by pre-RTA Amorphization of Si. IEEE Electron Device Letters, 27(2), 93-95.
dc.identifier.uri http://hdl.handle.net/10220/8338
dc.description.abstract Erbium silicide Schottky diodes formed on Si(001) substrate using rapid thermal annealing method show degraded Schottky-barrier height ϕ_Beff and ideality factor due to the presence of silicide-induced microstructural defects which are likely sources of trap states. A method to improve the ϕ_Beff and of the diodes utilizing in situ Ar plasma cleaning to induce a light amorphization of the Si(001) substrate is proposed. Even though the diodes formed in this way are less textured and have a poorer interface, they are free of silicide-induced microstructural defects, leading to an overall improvement in current transport and conduction properties which can be modeled using inhomogenous Schottky contact model.
dc.language.iso en
dc.relation.ispartofseries IEEE electron device letters
dc.rights © 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: http://dx.doi.org/10.1109/LED.2005.863142.
dc.subject DRNTU::Engineering::Materials
dc.title Improved electrical performance of Erbium silicide Schottky diodes formed by pre-RTA amorphization of Si
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1109/LED.2005.863142
dc.description.version Accepted version

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