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Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization

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Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization

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dc.contributor.author Kasim, J.
dc.contributor.author Tee, X. Y.
dc.contributor.author You, Y. M.
dc.contributor.author Ni, Zhenhua
dc.contributor.author Setiawan, Y.
dc.contributor.author Lee, Pooi See
dc.contributor.author Chan, L.
dc.contributor.author Shen, Zexiang
dc.date.accessioned 2012-09-13T03:32:45Z
dc.date.available 2012-09-13T03:32:45Z
dc.date.copyright 2008
dc.date.issued 2012-09-13
dc.identifier.citation Kasim, J., Tee, X. Y., You, Y. M., Ni, Z. H., Setiawan, Y., Lee, P. S., et al. (2008). Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization. Journal of raman spectroscopy, 39(10), 1338-1342.
dc.identifier.uri http://hdl.handle.net/10220/8513
dc.description.abstract Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up to 25.4 times as compared to that without a silver coating. This technique will be very useful for Raman study on samples that suffer overlapping background signal. In this article, we show that it can be used to significantly improve the signal of thin strained-Si layer on top of SiGe buffer layer.
dc.language.iso en
dc.relation.ispartofseries Journal of Raman spectroscopy
dc.rights © 2008 John Wiley & Sons, Ltd.
dc.subject DRNTU::Engineering::Materials.
dc.title Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1002/jrs.1999

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