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Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers.

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Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers.

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dc.contributor.author Zhang, Hua.
dc.contributor.author Müllen, Klaus.
dc.contributor.author De Feyter, Steven.
dc.date.accessioned 2012-09-24T01:07:50Z
dc.date.available 2012-09-24T01:07:50Z
dc.date.copyright 2007
dc.date.issued 2012-09-24
dc.identifier.citation Zhang, H., Müllen, K., & De Feyter, S. (2007). Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers. Journal of Physical Chemistry C, 111(23), 8142-8144.
dc.identifier.issn 1932-7447
dc.identifier.uri http://hdl.handle.net/10220/8605
dc.description.abstract Pulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-assembled monolayers (SAMs). Although from the AFM topographic image the dendrimers could not be discriminated, from the adhesion image, the respective homoaggregates were easily discriminated. The determination is based on the different adhesive interactions between the dendrimers and the chemically modified tip, which are related to the chemical nature of the outer-surface functional groups, and the adsorbed water layer on hydrophilic surfaces under ambient conditions. It shows that PFM-AFM with chemically modified tips has nanoscale chemical spatial resolution.
dc.language.iso en
dc.relation.ispartofseries Journal of physical chemistry C
dc.rights © 2007 American Chemical Society.
dc.subject DRNTU::Engineering::Materials.
dc.title Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers.
dc.type Journal Article
dc.contributor.school School of Materials Science and Engineering
dc.identifier.doi http://dx.doi.org/10.1021/jp073388u

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