| dc.contributor.author |
Liu, Hongmei. |
| dc.contributor.author |
Wang, Nan. |
| dc.contributor.author |
Zhao, Jianwei. |
| dc.contributor.author |
Guo, Yan. |
| dc.contributor.author |
Yin, Xing. |
| dc.contributor.author |
Boey, Freddy Yin Chiang. |
| dc.contributor.author |
Zhang, Hua. |
| dc.date.accessioned |
2012-09-24T03:29:48Z |
| dc.date.available |
2012-09-24T03:29:48Z |
| dc.date.copyright |
2008 |
| dc.date.issued |
2012-09-24 |
| dc.identifier.citation |
Liu, H., Wang, N., Zhao, J., Guo, Y., Yin, X., Boey, F. Y. C., & Zhang, H. (2008). Length-dependent conductance of molecular wires and contact resistance in metal–molecule–metal junctions. ChemPhysChem, 9(10), 1416-1424. |
| dc.identifier.issn |
1439-7641 |
| dc.identifier.uri |
http://hdl.handle.net/10220/8611 |
| dc.description.abstract |
Molecular wires are covalently bonded to gold electrodes—to form metal–molecule–metal junctions—by functionalizing each end with a SH group. The conductance of a wide variety of molecular junctions is studied theoretically by using first-principles density functional theory (DFT) combined with the nonequilibrium Green′s function (NEGF) formalism. Based on the chain-length-dependent conductance of the series of molecular wires, the attenuation factor β is obtained and compared with the experimental data. The β value is quantitatively correlated to the molecular HOMO–LUMO gap. Coupling between the metallic electrode and the molecular bridge plays an important role in electron transport. A contact resistance of 6.0±2.0 KΩ is obtained by extrapolating the molecular-bridge length to zero. This value is of the same magnitude as the quantum resistance. |
| dc.language.iso |
en |
| dc.relation.ispartofseries |
ChemPhysChem |
| dc.rights |
© 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. |
| dc.subject |
DRNTU::Engineering::Materials. |
| dc.title |
Length-dependent conductance of molecular wires and contact resistance in metal–molecule–metal junctions. |
| dc.type |
Journal Article |
| dc.contributor.school |
School of Materials Science and Engineering |
| dc.identifier.doi |
http://dx.doi.org/10.1002/cphc.200800032 |