mirage

An analytical method to study the effects of a substrate in surface-enhanced Raman scattering

DSpace/Manakin Repository

 

Search DR-NTU


Advanced Search Subject Search

Browse

My Account

An analytical method to study the effects of a substrate in surface-enhanced Raman scattering

Show simple item record

dc.contributor.author Huang, Shao Ying
dc.contributor.author Wu, Bae-Ian
dc.contributor.author Zhang, Baile
dc.contributor.author Lee, Yee Hui
dc.contributor.author Liberman, Vladimir
dc.contributor.author Rothschild, Mordechai
dc.date.accessioned 2012-10-29T00:50:51Z
dc.date.available 2012-10-29T00:50:51Z
dc.date.copyright 2009
dc.date.issued 2012-10-29
dc.identifier.citation Huang, S. Y., Wu, B. I., Zhang, B., Lee, Y. H., Liberman, V., & Rothschild, M. (2009). An analytical method to study the effects of a substrate in surface-enhanced Raman scattering. Journal of Applied Physics, 106(11).
dc.identifier.issn 00218979
dc.identifier.uri http://hdl.handle.net/10220/8804
dc.description.abstract In studies of surface-enhanced Raman scattering (SERS), individual metal nanoparticle and particle assemblies introduce enhancement of electromagnetic fields. However, the contributions to enhancement due to the substrate supporting the particles are yet to be studied analytically. In this communication, we present an analytical method to investigate the effect of a substrate with realistic layers in SERS. The proposed method quantifies the effect of a substrate on the electric field on the nanoparticles surface in SERS experiments. By applying the proposed method, optimal constructions of a substrate can be obtained to maximize the surface electric field while a poorly constructed one can be avoided. The maximization can lead to a high Raman enhancement factor. The method is verified using numerical simulations.
dc.language.iso en
dc.relation.ispartofseries Journal of applied physics
dc.rights © 2009 American Institute of Physics. This paper was published in Journal of Applied Physics and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: http://dx.doi.org/10.1063/1.3264635.  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
dc.subject DRNTU::Science::Mathematics::Number theory.
dc.title An analytical method to study the effects of a substrate in surface-enhanced Raman scattering
dc.type Journal Article
dc.contributor.school School of Physical and Mathematical Sciences
dc.identifier.doi http://dx.doi.org/10.1063/1.3264635
dc.description.version Published version

Files in this item

Files Size Format View
jap_2009_106_11.pdf 555.2Kb PDF View/Open

This item appears in the following Collection(s)

Show simple item record

Statistics

Total views

All Items Views
An analytical method to study the effects of a substrate in surface-enhanced Raman scattering 207

Total downloads

All Bitstreams Views
jap_2009_106_11.pdf 134

Top country downloads

Country Code Views
United States of America 52
China 39
Taiwan 13
Singapore 11
Egypt 4

Top city downloads

city Views
Mountain View 38
Beijing 34
Singapore 11
Redwood City 5
Taipei 5

Downloads / month

  2014-05 2014-06 2014-07 total
jap_2009_106_11.pdf 0 0 10 10