Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/93970
Title: | X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials | Authors: | Dong, Zhili | Issue Date: | 2009 | Source: | Dong, Z. L. (2009). X-ray diffraction, Rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials. Handbook of Nanoceramics and Their Based Nanodevices (pp. 303-336). USA: American Scientific Publishers. | Series/Report no.: | Handbook of nanoceramics and their based nanodevices | Abstract: | Abstract not available. | URI: | https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215 |
Schools: | School of Materials Science & Engineering | Rights: | © 2009 American Scientific Publishers. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | MSE Journal Articles |
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