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Browsing 1. Schools by Author "International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18th:2011:Incheon)"

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Browsing 1. Schools by Author "International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18th:2011:Incheon)"

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Date Title Author Type
2011
3D current path in stacked devices: metrics and challenges.
Kor, H. B.; Infante, F.; Perdu, P.; Gan, C. L.; Lewis, D.
Conference Paper