Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/3338
Title: | RF testing of QPSK device | Authors: | Chan, Siew Meng. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits | Issue Date: | 2004 | Abstract: | The concepts of RF testing of a QPSK device are introduced and followed by the presentation of the simulation results of a common RF tests involving a Quadrature Phase Shift Keying (QPSK) modulator and demodulator. | URI: | http://hdl.handle.net/10356/3338 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Theses |
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File | Description | Size | Format | |
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EEE-THESES_121.pdf Restricted Access | 6.88 MB | Adobe PDF | View/Open |
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