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https://hdl.handle.net/10356/46397
Title: | High frequency characterization & analysis of advanced Si MOSFETS | Authors: | Ng, Jing Ting. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Semiconductors | Issue Date: | 2011 | Abstract: | This report compiled all the work that had been done by the author during her Final Year Project subject to fulfill the course requirement under School of Electrical and Electronic Engineering (EEE), Nanyang Technological University. | URI: | http://hdl.handle.net/10356/46397 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
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File | Description | Size | Format | |
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Report.pdf Restricted Access | 1.88 MB | Adobe PDF | View/Open |
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