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https://hdl.handle.net/10356/4921
Title: | Development of IC test platform for DSP integrated circuit applications | Authors: | Nagarajan Cheliyan | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits | Issue Date: | 2002 | Abstract: | This project is to develop a test platform for implementation of DSP chip functional and timing measurements. | URI: | http://hdl.handle.net/10356/4921 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Theses |
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File | Description | Size | Format | |
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EEE-THESES_907.pdf Restricted Access | 11.87 MB | Adobe PDF | View/Open |
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