Browsing by Author Ang, Diing Shenp

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Issue DateTitleAuthor(s)
2018First principle investigation of electronic transport properties of the edge shaped graphene-porphine molecular junction deviceKole, Abhisek; Ang, Diing Shenp
2016Gold-free contacts on Al x Ga 1-x N/GaN high electron mobility transistor structure grown on a 200-mm diameter Si(111) substrateTham, Wai Hoe; Ang, Diing Shenp; Bera, Lakshmi Kanta; Surani Bin Doimanan; Bhat, Thirumaleshwara N.; Kajen, Rasanayagam S.; Tan, Hui Ru; Teo, Siew Lang; Tripathy, Sudhiranjan
2020Highly transparent ITO/HfO2/ITO device for visible-light sensingKalaga, Pranav Sairam; Kumar, Dayanand; Ang, Diing Shenp; Tsakadze, Zviad
2013Impact of Lanthanum on positive-bias temperature instability - insight from first-principles simulationGu, Chen Jie; Ang, Diing Shenp
2016Impact of voltage-accelerated stress on hole trapping at operating conditionTung, Zhi Yan; Ang, Diing Shenp
2019Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapsesBerco, Dan; Ang, Diing Shenp
2013Interfacial chemistry and valence band offset between GaN and Al2O3 studied by X-ray photoelectron spectroscopyDuan, T. L.; Pan, J. S.; Ang, Diing Shenp
2018Interfacial chemistry study of GaN by trimethylaluminum-only cycles and X-ray photoelectron spectroscopyAng, Diing Shenp; Gu, C. J.; Duan, T. L.; Pan, J. S.
 2012The link between NBTI and TDDB of high-k gate P-MOSFETsGao, Yuan; Ang, Diing Shenp
 2018Nanoscale conductive filament with alternating rectification as an artificial synapse building blockBerco, Dan; Zhou, Yu; Gollu, Sankara Rao; Kalaga, Pranav Sairam; Kole, Abhisek; Mohamed Hassan; Ang, Diing Shenp
2013Negative-bias temperature instability – insight from recent dynamic stress experimentsAng, Diing Shenp; Boo, A. A.; Gao, Yuan
 2013A new method for enhancing high- k /metal-gate stack performance and reliability for high- k last integrationYew, K. S.; Tang, L. J.; Ang, Diing Shenp
2016New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressingBoo, Ann Ann; Tung, Zhi Yan; Ang, Diing Shenp
2020A novel fabrication technique for three-dimensional concave nanolens arraysDuan, Tianli; Xu, Kang; Liu, Zhihong; Gu, Chenjie; Pan, Jisheng; Ang, Diing Shenp; Zhang, Rui; Wang, Yao; Ma, Xuhang
2019On the area scalability of valence-change memristors for neuromorphic computingAng, Diing Shenp; Zhou, Yu; Yew, Kwang Sing; Berco, Dan
2013On the evolution of switching oxide traps in the HfO2/TiN gate stack subjected to positive- and negative-bias temperature stressingGao, Yuan; Ang, Diing Shenp; Gu, Chen Jie
2017Optical reset modulation in the SiO 2 /Cu conductive-bridge resistive memory stackKawashima, Tomohito; Zhou, Yu; Yew, Kwang Sing; Ang, Diing Shenp
2018Optically reversible electrical soft-breakdown in wide-bandgap oxides — a factorial studyZhou, Yu; Ang, Diing Shenp; Kalaga, Pranav Sairam
2019An optoneuronic device with realistic retinal expressions for bioinspired machine visionBerco, Dan; Ang, Diing Shenp; Zhang, Hai Zhong
2015Restoration of postbreakdown gate oxide by white-light illuminationKawashima, Tomohito; Yew, Kwang Sing; Zhou, Yu; Ang, Diing Shenp; Bera, Milan Kumar; Zhang, Haizhong