Browsing by Author Ang, Diing Shenp

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Issue DateTitleAuthor(s)
2017A vacancy-interstitial defect pair model for positive-bias temperature stress-induced electron trapping transformation in the high-κ gate n-MOSFETGu, Chenjie; Ang, Diing Shenp; Gao, Yuan; Gu, Renyuan; Zhao, Ziqi; Zhu, Chao
2015White-light-induced annihilation of percolation paths in SIO2 and high-k dielectrics - prospect for gate oxide reliability rejuvenation and optical-enabled functions in CMOS integrated circuitsAng, Diing Shenp; Kawashima, Tomohito; Zhou, Yu; Yew, Kwang Sing; Bera, Milan Kumar; Zhang, Haizhong
2015White-light-induced disruption of nanoscale conducting filament in hafniaZhang, H. Z.; Bersuker, G.; Zhou, Y.; Yew, Kwang Sing; Ang, Diing Shenp; Kawashima, Tomohito; Bera, Milan Kumar