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Asundi, Anand Krishna
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Showing results 53 to 72 of 83
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Issue Date
Title
Author(s)
2009
Optical alignment of a cylindrical object
Song, Chaolong
;
Nguyen, Nam-Trung
;
Asundi, Anand Krishna
2018
Optical image encryption via high-quality computational ghost imaging using iterative phase retrieval
Asundi, Anand Krishna
;
Sui, Liansheng
;
Cheng, Yin
;
Li, Bing
;
Tian, Ailing
1999
Optical triangular profilometry : studies of calibration and fringe pattern processing
Zhou, Wensen.
2018
An optical watermarking scheme with two-layer framework based on computational ghost imaging
Liansheng, Sui
;
Yin, Cheng
;
Ailing, Tian
;
Asundi, Anand Krishna
2004
Optimization of Raman system for chemical detection
Leong, Jackson.
2005
Packaging of optical diffraction strain sensor
Duan, Lin.
2013
Phase aberration compensation in digital holographic microscopy based on principal component analysis
Qu, Weijuan
;
Asundi, Anand Krishna
;
Zuo, Chao
;
Chen, Qian
2007
Phase measurement errors due to holographic interferograms compression
Soraghan, John J.
;
Darakis, Emmanouil
;
Singh, Vijay Raj
;
Asundi, Anand Krishna
2012
Phase retrieval from reflective fringe patterns of double-sided transparent objects
Huang, Lei
;
Asundi, Anand Krishna
2012
Phase shift reflectometry for sub-surface defect detection
Asundi, Anand Krishna
;
Lei, Huang
;
Teoh, Eden Kang Min
;
Sreemathy, Parthasarathy
;
May, Watt Sook
2015
Phase shift reflectometry for wafer inspection
Peng, Kuang
;
Cao, Yiping
;
Li, Hongru
;
Sun, Jianfei
;
Bourgade, Thomas
;
Asundi, Anand Krishna
2008
Processing of digital holograms for size measurements of microparticlese
Naughton, Thomas J.
;
Darakis, Emmanouil
;
Khanam, Taslima
;
Rajendran, Arvind
;
Kariwala, Vinay
;
Asundi, Anand Krishna
2013
Quantitative phase from defocused intensity by image deconvolution
Zuo, Chao
;
Chen, Qian
;
Asundi, Anand Krishna
2011
Rapid defect detections of bonded wafer using near infrared polariscope
Asundi, Anand Krishna
;
Ng, Chi Seng
2000
Residual stress measurement in composite materials
Asundi, Anand Krishna
;
Chai, Gin Boay
;
Wong, Brian Stephen
;
Gan, W. S.
2000
Residual stress measurement in composite materials
Liu, Yu.
2013
Single-shot quantitative phase microscopy with the transport-of-intensity equation
Zuo, Chao
;
Chen, Qian
;
Qu, Weijuan
;
Asundi, Anand Krishna
2017
Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystal
Guan, Lichao
;
Ding, Jiexiong
;
Du, Li
;
Adhikari, Achyut
;
Asundi, Anand Krishna
2011
Studies on aperture synthesis in digital Fresnel holography
Hao, Yan
;
Asundi, Anand Krishna
2003
Studies on digital holography and interferometric application in micromeasurement
Xu, Lei.