Browsing by Author Asundi, Anand Krishna

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Issue DateTitleAuthor(s)
2009Method for compensation of transverse dispersion in electro-holographyYu, Yingjie; Wang, Tao; Dai, Linmao; Zheng, Huadong; Asundi, Anand Krishna
2004Micro optical probe sensor (MOPS) for dynamic in plane displacement sensingLuo, Xiaoming.
2009A micro optofluidic lens with short focal lengthSong, Chaolong; Nguyen, Nam-Trung; Tan, Say-Hwa; Asundi, Anand Krishna
2009Modelling and optimization of micro optofluidic lensesSong, Chaolong; Nguyen, Nam-Trung; Tan, Say-Hwa; Asundi, Anand Krishna
 2011Mueller–Stokes polarimetric characterization of transmissive liquid crystal spatial light modulatorDev, Kapil; Asundi, Anand Krishna
2010Multi-functional, optofluidic, in-plane, bi-concave lens : tuning light beam from focused to divergentSong, Chaolong; Nguyen, Nam-Trung; Yap, Yit Fatt; Luong, Trung-Dung; Asundi, Anand Krishna
 2012Nanosphere templated metallic grating assisted enhanced fluorescenceDinish, U. S.; Hegde, Gopalkrishna M.; Kannadorai, Ravi Kumar; Fu, Chit Yaw; Olivo, Malini; Asundi, Anand Krishna
2013Noninterferometric single-shot quantitative phase microscopyZuo, Chao; Chen, Qian; Qu, Weijuan; Asundi, Anand Krishna
2008On-line digital holographic measurement of size and shape of microparticles for crystallization processesNaughton, Thomas J.; Khanam, Taslima; Darakis, Emmanouil; Rajendran, Arvind; Kariwala, Vinay; Asundi, Anand Krishna
2009Optical alignment of a cylindrical objectSong, Chaolong; Nguyen, Nam-Trung; Asundi, Anand Krishna
2018Optical image encryption via high-quality computational ghost imaging using iterative phase retrievalAsundi, Anand Krishna; Sui, Liansheng; Cheng, Yin; Li, Bing; Tian, Ailing
1999Optical triangular profilometry : studies of calibration and fringe pattern processingZhou, Wensen.
 2018An optical watermarking scheme with two-layer framework based on computational ghost imagingLiansheng, Sui; Yin, Cheng; Ailing, Tian; Asundi, Anand Krishna
2004Optimization of Raman system for chemical detectionLeong, Jackson.
2005Packaging of optical diffraction strain sensorDuan, Lin.
2013Phase aberration compensation in digital holographic microscopy based on principal component analysisQu, Weijuan; Asundi, Anand Krishna; Zuo, Chao; Chen, Qian
2007Phase measurement errors due to holographic interferograms compressionSoraghan, John J.; Darakis, Emmanouil; Singh, Vijay Raj; Asundi, Anand Krishna
 2012Phase retrieval from reflective fringe patterns of double-sided transparent objectsHuang, Lei; Asundi, Anand Krishna
2012Phase shift reflectometry for sub-surface defect detectionAsundi, Anand Krishna; Lei, Huang; Teoh, Eden Kang Min; Sreemathy, Parthasarathy; May, Watt Sook
2015Phase shift reflectometry for wafer inspectionPeng, Kuang; Cao, Yiping; Li, Hongru; Sun, Jianfei; Bourgade, Thomas; Asundi, Anand Krishna