Showing results 52 to 71 of 83
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| Issue Date | Title | Author(s) |
 | 2008 | On-line digital holographic measurement of size and shape of microparticles for crystallization processes | Naughton, Thomas J.; Khanam, Taslima; Darakis, Emmanouil; Rajendran, Arvind; Kariwala, Vinay; Asundi, Anand Krishna |
| 2009 | Optical alignment of a cylindrical object | Song, Chaolong; Nguyen, Nam-Trung; Asundi, Anand Krishna |
| 2018 | Optical image encryption via high-quality computational ghost imaging using iterative phase retrieval | Asundi, Anand Krishna; Sui, Liansheng; Cheng, Yin; Li, Bing; Tian, Ailing |
 | 1999 | Optical triangular profilometry : studies of calibration and fringe pattern processing | Zhou, Wensen. |
| | 2018 | An optical watermarking scheme with two-layer framework based on computational ghost imaging | Liansheng, Sui; Yin, Cheng; Ailing, Tian; Asundi, Anand Krishna |
| 2004 | Optimization of Raman system for chemical detection | Leong, Jackson. |
| 2005 | Packaging of optical diffraction strain sensor | Duan, Lin. |
| 2013 | Phase aberration compensation in digital holographic microscopy based on principal component analysis | Qu, Weijuan; Asundi, Anand Krishna; Zuo, Chao; Chen, Qian |
| 2007 | Phase measurement errors due to holographic interferograms compression | Soraghan, John J.; Darakis, Emmanouil; Singh, Vijay Raj; Asundi, Anand Krishna |
| | 2012 | Phase retrieval from reflective fringe patterns of double-sided transparent objects | Huang, Lei; Asundi, Anand Krishna |
| 2012 | Phase shift reflectometry for sub-surface defect detection | Asundi, Anand Krishna; Lei, Huang; Teoh, Eden Kang Min; Sreemathy, Parthasarathy; May, Watt Sook |
| 2015 | Phase shift reflectometry for wafer inspection | Peng, Kuang; Cao, Yiping; Li, Hongru; Sun, Jianfei; Bourgade, Thomas; Asundi, Anand Krishna |
| 2008 | Processing of digital holograms for size measurements of microparticlese | Naughton, Thomas J.; Darakis, Emmanouil; Khanam, Taslima; Rajendran, Arvind; Kariwala, Vinay; Asundi, Anand Krishna |
| 2013 | Quantitative phase from defocused intensity by image deconvolution | Zuo, Chao; Chen, Qian; Asundi, Anand Krishna |
| 2011 | Rapid defect detections of bonded wafer using near infrared polariscope | Asundi, Anand Krishna; Ng, Chi Seng |
| 2000 | Residual stress measurement in composite materials | Liu, Yu. |
| 2000 | Residual stress measurement in composite materials | Asundi, Anand Krishna; Chai, Gin Boay; Wong, Brian Stephen; Gan, W. S. |
| 2013 | Single-shot quantitative phase microscopy with the transport-of-intensity equation | Zuo, Chao; Chen, Qian; Qu, Weijuan; Asundi, Anand Krishna |
| 2017 | Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystal | Guan, Lichao; Ding, Jiexiong; Du, Li; Adhikari, Achyut; Asundi, Anand Krishna |
| | 2011 | Studies on aperture synthesis in digital Fresnel holography | Hao, Yan; Asundi, Anand Krishna |
