Browsing by Author Asundi, Anand Krishna

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Issue DateTitleAuthor(s)
2008On-line digital holographic measurement of size and shape of microparticles for crystallization processesNaughton, Thomas J.; Khanam, Taslima; Darakis, Emmanouil; Rajendran, Arvind; Kariwala, Vinay; Asundi, Anand Krishna
2009Optical alignment of a cylindrical objectSong, Chaolong; Nguyen, Nam-Trung; Asundi, Anand Krishna
2018Optical image encryption via high-quality computational ghost imaging using iterative phase retrievalAsundi, Anand Krishna; Sui, Liansheng; Cheng, Yin; Li, Bing; Tian, Ailing
1999Optical triangular profilometry : studies of calibration and fringe pattern processingZhou, Wensen.
 2018An optical watermarking scheme with two-layer framework based on computational ghost imagingLiansheng, Sui; Yin, Cheng; Ailing, Tian; Asundi, Anand Krishna
2004Optimization of Raman system for chemical detectionLeong, Jackson.
2005Packaging of optical diffraction strain sensorDuan, Lin.
2013Phase aberration compensation in digital holographic microscopy based on principal component analysisQu, Weijuan; Asundi, Anand Krishna; Zuo, Chao; Chen, Qian
2007Phase measurement errors due to holographic interferograms compressionSoraghan, John J.; Darakis, Emmanouil; Singh, Vijay Raj; Asundi, Anand Krishna
 2012Phase retrieval from reflective fringe patterns of double-sided transparent objectsHuang, Lei; Asundi, Anand Krishna
2012Phase shift reflectometry for sub-surface defect detectionAsundi, Anand Krishna; Lei, Huang; Teoh, Eden Kang Min; Sreemathy, Parthasarathy; May, Watt Sook
2015Phase shift reflectometry for wafer inspectionPeng, Kuang; Cao, Yiping; Li, Hongru; Sun, Jianfei; Bourgade, Thomas; Asundi, Anand Krishna
2008Processing of digital holograms for size measurements of microparticleseNaughton, Thomas J.; Darakis, Emmanouil; Khanam, Taslima; Rajendran, Arvind; Kariwala, Vinay; Asundi, Anand Krishna
2013Quantitative phase from defocused intensity by image deconvolutionZuo, Chao; Chen, Qian; Asundi, Anand Krishna
2011Rapid defect detections of bonded wafer using near infrared polariscopeAsundi, Anand Krishna; Ng, Chi Seng
2000Residual stress measurement in composite materialsLiu, Yu.
2000Residual stress measurement in composite materialsAsundi, Anand Krishna; Chai, Gin Boay; Wong, Brian Stephen; Gan, W. S.
2013Single-shot quantitative phase microscopy with the transport-of-intensity equationZuo, Chao; Chen, Qian; Qu, Weijuan; Asundi, Anand Krishna
2017Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystalGuan, Lichao; Ding, Jiexiong; Du, Li; Adhikari, Achyut; Asundi, Anand Krishna
 2011Studies on aperture synthesis in digital Fresnel holographyHao, Yan; Asundi, Anand Krishna